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The Dexela 2923 CMOS X-ray detector: A flat panel detector based on CMOS active pixel sensors for medical imaging applications

机译:Dexela 2923 CMOS X射线探测器:一种基于CMOS有源像素传感器的平板探测器,用于医学成像应用

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摘要

Complementary metal-oxide-semiconductors (CMOS) active pixel sensors (APS) have been introduced recently in many scientific applications. This work reports on the performance (in terms of signal and noise transfer) of an X-ray detector that uses a novel CMOS APS which was developed for medical X-ray imaging applications. For a full evaluation of the detector's performance, electro-optical and X-ray characterizations were carried out. The former included measuring read noise, full well capacity and dynamic range. The latter, which included measuring X-ray sensitivity, presampling modulation transfer function (pMTF), noise power spectrum (NPS) and the resulting detective quantum efficiency (DQE), was assessed under three beam qualities (28 kV, 50 kV (RQA3) and 70 kV (RQA5) using W/Al) all in accordance with the IEC standard. The detector features an in-pixel option for switching the full well capacity between two distinct modes, high full well (HFW) and low full well (LFW). Two structured CsI:Tl scintillators of different thickness (a thin one for high resolution and a thicker one for high light efficiency) were optically coupled to the sensor array to optimize the performance of the system for different medical applications. The electro-optical performance evaluation of the sensor results in relatively high read noise (∼360 e -), high full well capacity (∼1.5×10 6 e -) and wide dynamic range (∼73 dB) under HFW mode operation. When the LFW mode is used, the read noise is lower (∼165) at the expense of a reduced full well capacity (∼0.5×10 6 e -) and dynamic range (∼69 dB). The maximum DQE values at low frequencies (i.e. 0.5 lp/mm) are high for both HFW (0.69 for 28 kV, 0.71 for 50 kV and 0.75 for 70 kV) and LFW (0.69 for 28 kV and 0.7 for 50 kV) modes. The X-ray performance of the studied detector compares well to that of other mammography and general radiography systems, obtained under similar experimental conditions. This demonstrates the suitability of the detector for both mammography and general radiography, with the use of appropriate scintillators. The high DQE values obtained under low mammographic exposures (up to 0.65 for 22.3 μGy) matches the demand for high detectability in imaging of the dense breast. © 2012 Elsevier B.V.
机译:互补金属氧化物半导体(CMOS)有源像素传感器(APS)最近在许多科学应用中被引入。这项工作报告了使用新型CMOS APS的X射线探测器的性能(在信号和噪声传递方面),该CMOS APS是为医学X射线成像应用开发的。为了全面评估检测器的性能,进行了电光和X射线表征。前者包括测量读取噪声,全阱容量和动态范围。在三种光束质量(28 kV,50 kV(RQA3))下评估了后者,包括测量X射线灵敏度,预采样调制传递函数(pMTF),噪声功率谱(NPS)和所得的探测量子效率(DQE)。和70 kV(RQA5,使用W / Al)均符合IEC标准。该探测器具有像素内选项,可在两种不同的模式(高全阱(HFW)和低全阱(LFW))之间切换全阱容量。将两个不同厚度的结构化CsI:Tl闪烁体(用于高分辨率的薄闪烁体和用于高光效率的较厚闪烁体)光学耦合到传感器阵列,以优化系统在不同医学应用中的性能。在HFW模式下,传感器的光电性能评估会导致较高的读取噪声(〜360 e-),较高的全阱容量(〜1.5×10 6 e-)和较宽的动态范围(〜73 dB)。使用LFW模式时,读取噪声较低(〜165),其代价是降低了全阱容量(〜0.5×10 6 e-)和动态范围(〜69 dB)。对于HFW模式(28 kV为0.69,50 kV为0.71,70 kV为0.75)和LFW模式(28 kV为0.69,50 kV为0.7),低频(即0.5 lp / mm)时的最大DQE值都很高。所研究探测器的X射线性能与在类似实验条件下获得的其他乳房X线照相和普通X射线照相系统相媲美。这证明了使用适当的闪烁体,该探测器既适合乳腺X线摄影,也适合于一般放射线摄影。在低乳腺X射线照像下获得的高DQE值(对于22.3μGy高达0.65)与致密乳腺成像中高可检测性的需求匹配。 ©2012 Elsevier B.V.

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